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Volumn 74, Issue 2, 2003, Pages 1036-1042

Multiple sample manipulator with five degrees of freedom for angle-resolved spectroscopy in ultrahigh vacuum

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEGREES OF FREEDOM (MECHANICS); SILICA; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037329529     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1531828     Document Type: Review
Times cited : (2)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.