메뉴 건너뛰기




Volumn 42, Issue 4, 2003, Pages 682-690

Spectral interferometric microscope with tandem liquid-crystal Fabry-Perot interferometers for extension of the dynamic range in three-dimensional step-height measurement

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT EMITTING DIODES; LIGHT TRANSMISSION; LIQUID CRYSTALS; MICROSCOPES; STEEL;

EID: 0037327952     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.000682     Document Type: Article
Times cited : (13)

References (18)
  • 1
    • 0001158008 scopus 로고    scopus 로고
    • Optical frequency-domain microprofilometry with a frequency-tunable liquid-crystal Fabry-Perot etalon device
    • M. Kinoshita, M. Takeda, H. Yago, Y. Watanabe, and T. Ku-rokawa, “Optical frequency-domain microprofilometry with a frequency-tunable liquid-crystal Fabry-Perot etalon device,” Appl. Opt. 38, 7063-7068 (1999).
    • (1999) Appl. Opt. , vol.38 , pp. 7063-7068
    • Kinoshita, M.1    Takeda, M.2    Yago, H.3    Watanabe, Y.4    Ku-Rokawa, T.5
  • 2
    • 0019927495 scopus 로고
    • Fourier transform method of fringe-pattern analysis for computer-based topography and interferometry
    • M. Takeda, H. Ina, and S. Kobayashi, “Fourier transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156-160 (1982).
    • (1982) J. Opt. Soc. Am. , vol.72 , pp. 156-160
    • Takeda, M.1    Ina, H.2    Kobayashi, S.3
  • 3
    • 84903983714 scopus 로고
    • Profilometry with a coherence scanning microscope
    • B. S. Lee and T. C. Strand, “Profilometry with a coherence scanning microscope,” Appl. Opt. 29, 3784-3788 (1990).
    • (1990) Appl. Opt. , vol.29 , pp. 3784-3788
    • Lee, B.S.1    Strand, T.C.2
  • 4
    • 84975646278 scopus 로고
    • Three-dimensional sensing of rough surfaces by coherence radar
    • T. Dressel, G. Hausler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31, 919-925 (1992).
    • (1992) Appl. Opt. , vol.31 , pp. 919-925
    • Dressel, T.1    Hausler, G.2    Venzke, H.3
  • 5
    • 0028545665 scopus 로고
    • High-speed noncontact profiler based on scanning white-light interferometry
    • L. Deck and P. De Groot, “High-speed noncontact profiler based on scanning white-light interferometry,” Appl. Opt. 33, 7334-7338 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 7334-7338
    • Deck, L.1    De Groot, P.2
  • 6
    • 84880400781 scopus 로고
    • Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis
    • M. Suematsu and M. Takeda, “Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis,” Appl. Opt. 30, 4046-4055 (1991).
    • (1991) Appl. Opt. , vol.30 , pp. 4046-4055
    • Suematsu, M.1    Takeda, M.2
  • 7
    • 0028756999 scopus 로고
    • Fourier-transform speckle pro-filometry: Three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces
    • M. Takeda and H. Yamamoto, “Fourier-transform speckle pro-filometry: three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces,” Appl. Opt. 33, 7829-7837 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 7829-7837
    • Takeda, M.1    Yamamoto, H.2
  • 8
    • 0030234175 scopus 로고    scopus 로고
    • Rough surface profile measurement using speckle optical frequency domain reflec-tometry with an external cavity tunable diode laser
    • T. H. Barnes, T. Eiju, and K. Matsuda, “Rough surface profile measurement using speckle optical frequency domain reflec-tometry with an external cavity tunable diode laser,” Optik 103, 93-100 (1996).
    • (1996) Optik , vol.103 , pp. 93-100
    • Barnes, T.H.1    Eiju, T.2    Matsuda, K.3
  • 9
    • 0000213849 scopus 로고    scopus 로고
    • Wavelength-shift speckle interferometry for absolute profilometry using modehope free external cavity diode laser
    • H. J. Tiziani, B. Franze, and P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using modehope free external cavity diode laser,” J. Mod. Opt. 44, 1485-1496 (1997).
    • (1997) J. Mod. Opt. , vol.44 , pp. 1485-1496
    • Tiziani, H.J.1    Franze, B.2    Haible, P.3
  • 10
    • 0000932523 scopus 로고    scopus 로고
    • Wavelength scanning pro-filometry for real-time surface shape measurement
    • S. Kuwamura and I. Yamaguchi, “Wavelength scanning pro-filometry for real-time surface shape measurement,” Appl. Opt. 36, 4473-4482 (1997).
    • (1997) Appl. Opt. , vol.36 , pp. 4473-4482
    • Kuwamura, S.1    Yamaguchi, I.2
  • 11
    • 0035591919 scopus 로고    scopus 로고
    • Surface shape measurement by wavelength scanning interferometry using an electronically tuned Ti:Sap-phire laser
    • A. Yamamoto, C. C. Kuo, K. Sunouchi, S. Wada, I. Yamaguchi, and H. Tashiro, “Surface shape measurement by wavelength scanning interferometry using an electronically tuned Ti:sap-phire laser,” Opt. Rev. 8, 59-63 (2001).
    • (2001) Opt. Rev. , vol.8 , pp. 59-63
    • Yamamoto, A.1    Kuo, C.C.2    Sunouchi, K.3    Wada, S.4    Yamaguchi, I.5    Tashiro, H.6
  • 13
    • 0026883905 scopus 로고
    • Tunable wavelength-selective liquid-crystal filters for 600-channel FDM system
    • K. Hirabayashi, H. Tsuda, and T. Kurokawa, “Tunable wavelength-selective liquid-crystal filters for 600-channel FDM system,” IEEE Photon. Technol. Lett. 4, 597-599 (1992).
    • (1992) IEEE Photon. Technol. Lett. , vol.4 , pp. 597-599
    • Hirabayashi, K.1    Tsuda, H.2    Kurokawa, T.3
  • 14
    • 21544480437 scopus 로고
    • An electrically tunable optical filter for infra-red wavelength using liquid crystals in a Fabry-Perot etalon
    • J. S. Patel, M. A. Saifi, D. W. Berreman, C. Lin, and N. An-dreadakis, “An electrically tunable optical filter for infra-red wavelength using liquid crystals in a Fabry-Perot etalon,” Appl. Phys. Lett. 57, 1718-1720 (1990).
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 1718-1720
    • Patel, J.S.1    Saifi, M.A.2    Berreman, D.W.3    Lin, C.4    An-Dreadakis, N.5
  • 15
    • 0026116730 scopus 로고
    • Narrow-band tunable wavelength-selective filters of Fabry-Perot interferometers with a liquid crystal intracavity
    • K. Hirabayashi, H. Tsuda, and T. Kurokawa, “Narrow-band tunable wavelength-selective filters of Fabry-Perot interferometers with a liquid crystal intracavity,” IEEE Photon. Technol. Lett. 3, 213-215 (1991).
    • (1991) IEEE Photon. Technol. Lett. , vol.3 , pp. 213-215
    • Hirabayashi, K.1    Tsuda, H.2    Kurokawa, T.3
  • 17
    • 0027873050 scopus 로고
    • Tunable liquid-crystal Fabry-Perot interferometer filter for wavelength-division multiplexing communication systems
    • K. Hirabayashi, H. Tsuda, and T. Kurokawa, “Tunable liquid-crystal Fabry-Perot interferometer filter for wavelength-division multiplexing communication systems,” J. Lightwave Technol. 11, 2033-2043 (1993).
    • (1993) J. Lightwave Technol. , vol.11 , pp. 2033-2043
    • Hirabayashi, K.1    Tsuda, H.2    Kurokawa, T.3
  • 18
    • 84893889161 scopus 로고    scopus 로고
    • 5th ed. (Pergamon, New York, 1999), Chap. 10
    • M. Born and E. Wolf, Principles of Optics, 5th ed. (Pergamon, New York, 1999), Chap. 10, p. 175.
    • Principles of Optics , pp. 175
    • Born, M.1    Wolf, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.