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Optik (Jena)
Volumn 103, Issue 3, 1996, Pages 93-100
Rough surface profile measurement using Speckle Optical Frequency Domain Reflectometry with an external cavity tunable diode laser
Author keywords

[No Author keywords available]
Indexed keywords

FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; FREQUENCY MODULATION; INTERFEROMETERS; LASER TUNING; OPTICAL VARIABLES MEASUREMENT; SCANNING; SEMICONDUCTOR LASERS; SPECKLE; SURFACE MEASUREMENT; SURFACE ROUGHNESS;
EID: 0030234175     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (17)
References (15)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.