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Volumn 6, Issue 2, 2003, Pages

Cathodic depolarization effect during Cu electroplating on patterned wafers

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; ASPECT RATIO; CURRENT VOLTAGE CHARACTERISTICS; ELECTROLYTES; ELECTROPLATING; POLARIZATION; SILICON WAFERS;

EID: 0037323501     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1535754     Document Type: Article
Times cited : (20)

References (10)
  • 6
    • 0001978229 scopus 로고    scopus 로고
    • M. E. Gross, T. Gessner, N. Kobayashi, and Y. Yasuda, Editors; MRS, Warrendale, PA
    • J. Reid and S. Mayer, in Proceedings of the Advanced Metallization Conference, M. E. Gross, T. Gessner, N. Kobayashi, and Y. Yasuda, Editors, p. 53, MRS, Warrendale, PA (2000).
    • (2000) Proceedings of the Advanced Metallization Conference , pp. 53
    • Reid, J.1    Mayer, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.