Direct measurement of twist mosaic in epitaxial GaN

Physica Status Solidi (A) Applied Research

Volumn 195, Issue 1 SPEC, 2003, Pages 265-270

  Lafford, T A ^a   Ryan, P A ^a   Joyce, D E ^a   Goorsky, M S ^b,c   Tanner, B K ^b  

^a Bede Scientific Instruments Ltd   (United Kingdom)

^b DURHAM UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRAPOLATION; X RAY DIFFRACTION ANALYSIS; X RAY TUBES;

EPITAXIAL LAYERS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0037278473     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306270     Document Type: Conference Paper

References (8)

1. T. Lafford, N. Loxley, and B. K. Tanner, Mater. Res. Soc. Symp. Proc. 449, 483 (1997).
2. T. Metzger, R. Höpler, E. Born, O. Ambacher, M. Stutzmann, R. Stömmer, M. Schuster, H. Göbel, S. Christiansen, M. Albrecht, and H. P. Strunk, Philos, Mag. A 77, 1013 (1998).
3. J. Y. Shi, L. P. Yu, Y. Z. Wang, G. Y. Zhang, and H. Zhang, Appl. Phys. Lett. 80, 2293 (2002).
4. V. Srikant, J. S. Speck, and D. R. Clarke, J. Appl. Phys. 82, 4286 (1997).
5. H. Heinke, V. Kirschner, S. Einfeldt, and D. Hommel, phys. stat. sol. (a) 176, 391 (1999).
6. K. Kobayashi, A. A. Yamaguchi, S. Kimura, H. Sunakawa, A. Kimura, and A. Usui, Jpn. J. Appl. Phys. 38, L611 (1999).
7. M. S. Goorsky and B. K. Tanner, Cryst. Res. Technol. 37, 647 (2002).
8. H. Heinke, V. Kirschner, S. Einfeldt, and D. Hommel, Appl. Phys. Lett 77, 2145 (2000).