Analysis of direct tunneling for thin SiO2 film by Wentzel, Kramers, Brillouin method - Considering tail of distribution function

Solid-State Electronics

Volumn 47, Issue 1, 2003, Pages 161-163

  Matsuo, Naoto ^a   Takami, Yoshinori ^a   Kihara, Hiroyuki ^a  

^a YAMAGUCHI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC POTENTIAL; ELECTRON EMISSION; ELECTRON TUNNELING; FERMI LEVEL; FUNCTIONS; SILICA; SUBSTRATES;

DIRECT TUNNELING (DT);

THIN FILMS;

EID: 0037210895     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00274-5     Document Type: Article

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