Study of the homogeneity of Fe-doped semiinsulating InP wafers

Materials Research Society Symposium - Proceedings

Volumn 484, Issue , 1997, Pages 625-630

  Jimenez, J ^a   Fornari, R ^a   Curti, M ^a   de la Puente, E ^a   Avella, M ^a   Sanz, L F ^a   Gonzalez, M A ^a   Alvarez, A ^a  

^a Departamento de Fisica de la Materia Condensada   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON ENERGY LEVELS; HEAT TREATMENT; IRON; PHOTOLUMINESCENCE; SCANNING; SEMICONDUCTOR DOPING;

ELECTRICALLY ACTIVE LEVELS; MAPPING TECHNIQUES; MICROMETRIC SPATIAL RESOLUTION; SCANNING PHOTOCURRENT; SCANNING PHOTOLUMINESCENCE;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0031370091     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-484-625     Document Type: Conference Paper

References (11)