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Volumn 79, Issue 3, 2001, Pages 391-393
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Atomic-scale characterization of a Co/AlOx/Co magnetic tunnel junction by scanning transmission electron microscopy
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA;
COBALT COMPOUNDS;
DATA ACQUISITION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRONIC STRUCTURE;
FERMI LEVEL;
INTERFACES (MATERIALS);
MAGNETIC MOMENTS;
MAGNETORESISTANCE;
MAGNETRON SPUTTERING;
SPUTTER DEPOSITION;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
MAGNETIC TUNNEL JUNCTIONS;
TUNNEL JUNCTIONS;
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EID: 0035898510
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1383569 Document Type: Article |
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Times cited : (28)
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References (14)
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