Graded ferroelectric thin films: Possible origin of the shift along the polarization axis

Applied Physics Letters

Volumn 81, Issue 26, 2002, Pages 5015-5017

  Poullain, G ^a   Bouregba, R ^a   Vilquin, B ^a   Le Rhun, G ^a   Murray, H ^a  

^a LABORATOIRE CRISMAT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC POTENTIAL; FILM GROWTH; HYSTERESIS; LEAD COMPOUNDS; POLARIZATION;

OFFSET VOLTAGE;

FERROELECTRIC THIN FILMS;

EID: 0037164917     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1532771     Document Type: Article

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