Improvement of energy resolution of transient photoconductivity analysis for measuring localized-state distributions in amorphous semiconductors

Journal of Non-Crystalline Solids

Volumn 266-269 A, Issue , 2000, Pages 367-371

  Ogawa, Nobuyuki ^a   Nagase, Takashi ^a   Naito, Hiroyoshi ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346480732     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0022-3093(99)00732-2     Document Type: Article

References (6)

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2. H. Naito, J. Ding, M. Okuda, Appl. Phys. Lett. 64 (1994) 1830.
3. R. Brüggemann, C. Main, J. Berkin, S. Reynolds, Philos. Mag. B 62 (1990) 29.
4. J. Noolandi, Phys. Rev. B 16 (1977) 4466.
5. R.A. Street, Hydrogenated Amorphous Silicon, Cambridge University, Cambridge, 1991.
6. T. Nagase, K. Kishimoto, H. Naito, J. Appl. Phys. (accepted).