High resolution measurement of localized-state distributions from transient photoconductivity in amorphous and polymeric semiconductors

Journal of Applied Physics

Volumn 86, Issue 9, 1999, Pages 5026-5035

  Nagase, Takashi ^a   Kishimoto, Ko Hei ^a   Naito, Hiroyoshi ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000225084     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371474     Document Type: Article

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