Thermal annealing behaviour of Ni/Au on n-GaN Schottky contacts

Journal of Physics D: Applied Physics

Volumn 35, Issue 20, 2002, Pages 2648-2651

  Sun, Yuanping ^a   Shen, X M ^a   Wang, J ^a   Zhao, D G ^a   Feng, G ^a   Fu, Y ^a   Zhang, S M ^a   Zhang, Z H ^a   Feng, Z H ^a   Bai, Y X ^a   Yang, Hui ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; CURVE FITTING; ELECTRIC CONTACTS; ELECTRIC VARIABLES MEASUREMENT; GALLIUM NITRIDE; GOLD; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NICKEL; RAPID THERMAL ANNEALING; THERMODYNAMIC STABILITY;

HALL MEASUREMENT; NONLINEAR FITTING METHODS; SCHOTTKY BEHAVIOR;

SCHOTTKY BARRIER DIODES;

EID: 0037152698     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/20/326     Document Type: Article

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