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Volumn 191, Issue 1-4, 2002, Pages 240-246

The combining analysis of height and phase images in tapping-mode atomic force microscopy: A new route for the characterization of thiol-coated gold nanoparticle film on solid substrate

(4) Jiang, Peng a,b Xie, Si shen a Pang, Shi jin a Gao, Hong jun a

a INSTITUTE OF PHYSICS (China)

b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT (Germany)

Author keywords

Highly oriented pyrolytic graphite; Nanoparticle film; Tapping mode atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; GRAPHITE; METALLIC FILMS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PYROLYSIS; SOLUTIONS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG);

GOLD;

EID: 0037123529 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(02)00184-8 Document Type: Article

Times cited : (21)

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