Monte Carlo studies of stress fields and intermixing in Ge/Si(100) quantum dots

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 20, 2002, Pages 2053071-2053076

  Sonnet, Ph ^a,c   Kelires, P C ^a,b  

^a INSTITUTE OF COMPUTER SCIENCE   (Greece)

^b UNIVERSITY OF CRETE   (Greece)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; ELECTRONICS; MONTE CARLO METHOD; QUANTUM THEORY; SEMICONDUCTOR; SIMULATION; TEMPERATURE;

EID: 0037113459     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

1. K. Eberl, Phys. World 10, 47 (1997); O. G. Schmidt, C. Lange, and K. Eberl, Appl. Phys. Lett. 75, 1905 (1999).
2. K. Eberl, Phys. World 10, 47 (1997); O. G. Schmidt, C. Lange, and K. Eberl, Appl. Phys. Lett. 75, 1905 (1999).
3. J. Tersoff and R. M. Tromp, Phys. Rev. Lett. 70, 2782 (1993); J. Tersoff and F. K. LeGoues, ibid. 72, 3570 (1994).
4. J. Tersoff and R. M. Tromp, Phys. Rev. Lett. 70, 2782 (1993); J. Tersoff and F. K. LeGoues, ibid. 72, 3570 (1994).
5. A.-L. Barabási, Appl. Phys. Lett. 70, 2565 (1997); M. Kästner and B. Voigtländer, Phys. Rev. Lett. 82, 2745 (1999).
6. A.-L. Barabási, Appl. Phys. Lett. 70, 2565 (1997); M. Kästner and B. Voigtländer, Phys. Rev. Lett. 82, 2745 (1999).
7. J. Tersoff, C. Teichert, and M. G. Lagally, Phys. Rev. Lett. 76, 1675 (1996).
8. F. M. Ross, J. Tersoff, and R. M. Tromp, Phys. Rev. Lett. 80, 984 (1998).
9. S. A. Chaparro, J. Drucker, Y. Zhang, D. Chandrasekhar, M. R. McCartney, and D. J. Smith, Phys. Rev. Lett. 83, 1199 (1999).
10. S. A. Chaparro, Y. Zhang, J. Drucker, D. Chandrasekhar, and D. J. Smith, J. Appl. Phys. 87, 2245 (2000).
11. Y. Zhang, M. Floyd, K. P. Driver, J. Drucker, P. A. Crozier, and D. J. Smith, Appl. Phys. Lett. 80, 3623 (2002).
12. F. Boscherini, G. Capellini, L. Di Gaspare, F. Rosei, N. Motta, and S. Mobilio, Appl. Phys. Lett. 76, 682 (2000).
13. W. L. Henstrom, C. Liu, J. M. Gibson, T. I. Kamins, and R. S. Williams, Appl. Phys. Lett. 77, 1623 (2000).
14. G. Capellini, M. De Seta, and F. Evangelisti, Appl. Phys. Lett. 78, 303 (2001).
15. X. Z. Liao, J. Zou, D. J. H. Cockayne, J. Qin, Z. M. Jiang, X. Wang, and R. Leon, Phys. Rev. B 60, 15 605 (1999).
16. X. Z. Liao, J. Zou, D. J. H. Cockayne, Z. M. Jiang, X. Wang, and R. Leon, Appl. Phys. Lett. 77, 1304 (2000).
17. X. Z. Liao, J. Zou, D. J. H. Cockayne, Z. M. Jiang, and X. Wang, J. Appl. Phys. 90, 2725 (2001).
18. J. Tersoff, Phys. Rev. Lett. 81, 3183 (1998).
19. N. Liu, J. Tersoff, O. Baklenov, A. L. Holmes, Jr., and C. K. Shih, Phys. Rev. Lett. 84, 334 (2000).
20. P. C. Kelires and J. Tersoff, Phys. Rev. Lett. 63, 1164 (1989).
21. P. C. Kelires, Phys. Rev. Lett. 75, 1114 (1995).
22. P. C. Kelires and E. Kaxiras, Phys. Rev. Lett. 78, 3479 (1997).
23. Y.-W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, Phys. Rev. Lett. 65, 1020 (1990).
24. J. Tersoff, Phys. Rev. B 39, 5566 (1989).
25. Due to our definition of local stresses, a positive (negative) sign indicates compressive (tensile) stress.
26. N. Moll, M. Scheffler, and E. Pehlke, Phys. Rev. B 58, 4566 (1998).
27. D. E. Jesson, G. Chen, K. M. Chen, and S. J. Pennycook, Phys. Rev. Lett. 80, 5156 (1998).