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Volumn 92, Issue 10, 2002, Pages 5749-5755

Transmission electron microscopy study of the InP/InGaAs and InGaAs/InP heterointerfaces grown by metalorganic vapor-phase epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

CROSS-SECTIONAL TEM; DARK FIELD IMAGES; HETERO-INTERFACES; INALAS; INGAAS/INP; INP; INP/INGAAS; INTERFACE SURFACES; METAL-ORGANIC VAPOR PHASE EPITAXY; PHOSPHORUS ATOM; SURFACE UNDULATION; SWITCHING SEQUENCE; TRANSMISSION ELECTRON MICROSCOPY TEM;

EID: 0037113001     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1513891     Document Type: Article
Times cited : (57)

References (21)
  • 5
    • 0026924280 scopus 로고
    • mie MIENEF 0167-9317
    • R. Schwedler et al., Microelectron. Eng. 19, 891 (1992). mie MIENEF 0167-9317
    • (1992) Microelectron. Eng. , vol.19 , pp. 891
    • Schwedler, R.1
  • 19
    • 0035913150 scopus 로고    scopus 로고
    • ell ELLEAK 0013-5194
    • L. Giraudet et al., Electron. Lett. 37, 973 (2001). ell ELLEAK 0013-5194
    • (2001) Electron. Lett. , vol.37 , pp. 973
    • Giraudet, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.