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Volumn 195, Issue 1-4, 2002, Pages 107-116

Etching behaviour of pure and metal containing amorphous carbon films prepared using filtered cathodic vacuum arc technique

Author keywords

Filtered cathodic vacuum arc deposition; Metal containing carbon films; Reactive ion beam etching; Reactive ion etching; Tetrahedral amorphous carbon film

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CATHODES; DEPOSITION; ETCHING; MORPHOLOGY; PLASMAS; SURFACE ROUGHNESS; TITANIUM;

EID: 0037099252     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00552-4     Document Type: Article
Times cited : (7)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.