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Volumn 195, Issue 1-4, 2002, Pages 107-116
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Etching behaviour of pure and metal containing amorphous carbon films prepared using filtered cathodic vacuum arc technique
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Author keywords
Filtered cathodic vacuum arc deposition; Metal containing carbon films; Reactive ion beam etching; Reactive ion etching; Tetrahedral amorphous carbon film
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON;
CATHODES;
DEPOSITION;
ETCHING;
MORPHOLOGY;
PLASMAS;
SURFACE ROUGHNESS;
TITANIUM;
REACTIVE ION BEAM ETCHING (RIBE);
AMORPHOUS FILMS;
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EID: 0037099252
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(02)00552-4 Document Type: Article |
Times cited : (7)
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References (17)
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