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Volumn 91, Issue 2, 2002, Pages 605-612

Influences on ionization fraction in an inductively coupled ionized physical vapor deposition device plasma

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND GAS; EXPERIMENTAL SYSTEM; INDUCTIVELY-COUPLED; IONIZATION FRACTIONS; IONIZED PHYSICAL VAPOR DEPOSITION; LANGMUIR PROBE MEASUREMENTS; METAL ATOMS; MONTE CARLO; PLASMA CONDITIONS; PLASMA PARAMETER; SPUTTERED ATOMS;

EID: 0037080897     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1425447     Document Type: Article
Times cited : (14)

References (18)
  • 8
    • 33845395546 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Illinois-Urbana
    • D. R. Juliano, Ph.D. thesis, University of Illinois-Urbana, 2000.
    • (2000)
    • Juliano, D.R.1
  • 11
    • 33845383396 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Illinois-Urbana
    • D. B. Hayden, Ph.D. thesis, University of Illinois-Urbana, 1999.
    • (1999)
    • Hayden, D.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.