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Volumn 91, Issue 2, 2002, Pages 605-612
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Influences on ionization fraction in an inductively coupled ionized physical vapor deposition device plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
BACKGROUND GAS;
EXPERIMENTAL SYSTEM;
INDUCTIVELY-COUPLED;
IONIZATION FRACTIONS;
IONIZED PHYSICAL VAPOR DEPOSITION;
LANGMUIR PROBE MEASUREMENTS;
METAL ATOMS;
MONTE CARLO;
PLASMA CONDITIONS;
PLASMA PARAMETER;
SPUTTERED ATOMS;
COMPUTER SIMULATION;
ELECTROMAGNETIC INDUCTION;
EXPERIMENTS;
HEATING;
IONIZATION OF GASES;
PHYSICAL VAPOR DEPOSITION;
VAPORS;
MONTE CARLO METHODS;
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EID: 0037080897
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1425447 Document Type: Article |
Times cited : (14)
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References (18)
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