X-ray scattering from epitaxial GaSb/InAs thin films below and above the critical thickness

Journal of Physics Condensed Matter

Volumn 14, Issue 30, 2002, Pages 7101-7121

  Babkevich, A Yu ^a   Cowley, R A ^a   Mason, N J ^a   Sandiford, S ^a   Stunault, A ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; DISLOCATIONS (CRYSTALS); GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LATTICE CONSTANTS; METALLORGANIC VAPOR PHASE EPITAXY; SINGLE CRYSTALS; STRAIN; X RAY DIFFRACTION;

CRITICAL THICKNESS;

THIN FILMS;

EID: 0037025902     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/30/302     Document Type: Article

References (17)