Quantitative in situ x-ray diffraction analysis of magnetic multilayers during annealing

Journal of Applied Physics

Volumn 80, Issue 3, 1996, Pages 1437-1445

  Chladek M ^a   Dorner, C ^b   Buchal, A ^c   Valvoda, V ^a   Hoffmann, H ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF REGENSBURG   (Germany)

^c BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346513960     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363011     Document Type: Article

References (37)

1. M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen Van Dau, F. Petroff, P. E. Etienne, G. Creuzet, A. Friederich, and J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988).
2. G. Binasch, P. Grünberg, F. Saurenbach, and W. Zinn, Phys. Rev. B 39, 4828 (1989).
3. S. S. P. Parkin, R. Bhadra, and K. P. Roche, Phys. Rev. Lett. 66, 2152 (1991).
4. A. Chaiken, P. Lubitz, J. J. Krebs, G. A. Prinz, and M. Z. Harford, J. Appl. Phys. 70, 5864 (1991).
5. B. Dieny, P. Humnert, V. S. Speriosu, S. Metin, B. A. Gurney, P. Baumgart, and H. Lefakis, Phys. Rev. B 45, 805 (1992).
6. J. Q. Xiao, J. S. Jiang, and C. L. Chien, Phys. Rev. Lett. 68, 3749 (1992).
7. A. E. Berkowitz, J. R. Mitchell, M. J. Carey, A. P. Young, S. Zhang, F. E. Spada, F. T. Parker, A. Hutten, and G. Thomas, Phys. Rev. Lett. 68, 3745 (1992).
8. M. A. Parker, K. R. Coffey, T. L. Hylton, and J. K. Howard, Mat. Res. Soc. Symp. Proc. 313, 85 (1993).
9. H. Zhang, R. W. Cochrane, Y. Huai, Ming Mao, X. Bian and W. B. Muir, J. Appl. Phys. 75, 6534 (1994).
10. J. D. Kim, A. K. Petford-Long, J. P. Jakubovics, J. E. Evetts, and R. Somekh, J. Appl. Phys. 76, 2387 (1994).
11. M. B. Stearns, Y. Cheng, J. Appl. Phys. 75, 6894 (1994).
12. M. A. Parker, T. L. Hylton, K. R. Coffey and J. K. Howard, J. Appl. Phys. 75, 6382 (1994).
13. B. Rodmacq, G. Palumbo, and Ph. Gerard, J. Magn. Magn. Mater. 118, L11 (1993).
14. E. E. Fullerton, I. K. Schuller, H. Vanderstraeten, and Y. Bruynseraede, Phys. Rev. B 45, 9292 (1992).
15. V. Holy, J. Kubena, I. Ohlídal, K. Lischka, and W. Plotz, Phys. Rev. B 47, 15896 (1993).
16. T. L. Hylton, K. R. Coffey, M. A. Parkerand, and J. K. Howard, Science 261, 1021 (1993).
17. R. F. C. Farrow, R. F. Marks, T. A. Rabedeau, M. F. Toney, D. Dobbertin, R. Beyers, and S. S. P. Parkin, J. Appl. Phys. 76, 3688 (1994).
18. G. Palasantazas and J. Krim, Phys. Rev. B 48, 2873 (1993).
19. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
20. W. Sevenhans, M. Gijs, Y. Bruynseraede, H. Homma, and I. K. Schuller, Phys. Rev. B 34, 5955 (1986).
21. E. Snoeck, R. Sinclair, M. A. Parker, T. L. Hylton, K. R. Coffey, J. K. Hovard, A. Lessmann, and A. I. Bienenstock, J. Magn. Magn. Mater. 151, 24 (1995).
22. K. Temst, M. J. Bael, B. Wuyts, C. Van Haesendonck, Y. Bruynseraede, D. G. de Groot, N. Koeman, and R. Griessen, Appl. Phys. Lett. 67, 3429 (1995).
23. L. G. Parrat, Phys. Rev. 95, 359 (1954).
24. D. E. Savage, J. Kleiner, N. Schimke, Y. H. Phang, T. Jankowski, J. Jacobs, R. Kariotis, and M. G. Lagally, J. Appl. Phys. 69, 1411 (1991).
25. L. Nevot and P. Croce, Rev. Phys. Appl. 15, 761 (1980).
26. R. Kuzel, Computer Program, Fac. Math., Charles University, Prague, Czech Republic.
27. T. H. de Keijser and J. I. Langford, J. Appl. Cryst. 15, 308 (1982).
28. We used only seven structural parameters and we avoided using the asymmetrical strain profiles at interfaces.
29. W. B. Pearson, A Handbook of Lattice Spacings and Structures of Metals and Alloys (Pergamon, London, Part I (1958), Part II (1967)).
30. W. B. Pearson, A Handbook of Lattice Spacings and Structures of Metals and Alloys (Pergamon, London, Part I (1958), Part II (1967)).
31. The measured FWHM of a Ω scan is narrower.
32. PC-PDF 2.12 database JCPDS.
33. For example, Co/Cu, Ag/NiFe, Nb/Cu; in semiconductor or x-ray mirrors applications, the lateral coherence length ξ is typically much more longer (≈5000 Å).
34. C. Dorner, M. Chládek, M. Matner, H. Hoffmann, and V. Valvoda, Phys. Rev. B (to be published).
35. NiFe would not bring this effect. See the parameter definition above Eq. (1).
36. Contrary to proposed modest migration (Ref. 17) of Ag from the NiFeAg layer.
37. M. J. Kim and R. W. Carpenter, Ultramicroscopy 21, 327 (1987).