Nanoscale Co/Cu multilayers investigated by analytical TEM and AES

Mikrochimica Acta

Volumn 133, Issue 1-4, 2000, Pages 131-135

  Thomas, Jürgen ^a   John, Andreas ^a   Wetzig, Klaus ^a  

^a IFW DRESDEN   (Germany)

Author keywords

AES depth profiles; Analytical TEM; Co Cu multilayer; EDXS; EELS; PLD

Indexed keywords

EID: 0001655110     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040070082     Document Type: Article

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