Influence of annealing on structural properties of metallic multilayers

Materials Science Forum

Volumn 378-381, Issue II, 2001, Pages 370-375

  Hecker, M ^a   Van Loyen, L ^a   Tietjen, D ^a   Schell, N ^a   Schneider, C M ^a  

^a IFW DRESDEN   (Germany)

Author keywords

GMR effect; Multilayers; Reflectometry; Synchrotron radiation; X ray diffraction

Indexed keywords

ANNEALING; GIANT MAGNETORESISTANCE; INTERFACES (MATERIALS); MAGNETIC FIELD EFFECTS; MULTILAYERS; SPUTTERING; STRUCTURE (COMPOSITION); SURFACE ROUGHNESS; SYNCHROTRON RADIATION; TENSILE STRESS; X RAY DIFFRACTION ANALYSIS;

LATTICE PROPERTIES; METALLIC MULTILAYERS; STRUCTURAL PROPERTIES; X RAY REFLECTOMETRY;

METALLIC FILMS;

EID: 0035178678     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (9)