메뉴 건너뛰기




Volumn 1, Issue , 2002, Pages 239-242

Temperature coefficients of SAW velocity for AlN thin film sputtered on ST-X quartz

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC WAVE VELOCITY; ALUMINUM NITRIDE; MAGNETRON SPUTTERING; NUMERICAL ANALYSIS; QUARTZ; SPUTTER DEPOSITION; THERMAL EFFECTS; THERMODYNAMIC STABILITY; THICKNESS MEASUREMENT; THIN FILMS;

EID: 0036995023     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (19)
  • 3
    • 0022115013 scopus 로고
    • Zero-temperature-coefficient SAW devices on AlN epitaxial films
    • K. Tsubouchi, and N. Mikoshiba, "Zero-temperature-coefficient SAW devices on AlN epitaxial films," IEEE Trans. Son. and Ultrason., vol. SU-32, pp. 634-644, 1985.
    • (1985) IEEE Trans. Son. and Ultrason. , vol.SU-32 , pp. 634-644
    • Tsubouchi, K.1    Mikoshiba, N.2
  • 6
    • 0030100686 scopus 로고    scopus 로고
    • Morphology and structure of aluminum nitride thin films on glass substrates
    • C. C. Cheng, Y. C. Chen, H. J. Wang, and W. R. Chen, "Morphology and structure of aluminum nitride thin films on glass substrates," Jpn. J. Appl. Phys., vol. 35, pp. 1880-1885, 1996.
    • (1996) Jpn. J. Appl. Phys. , vol.35 , pp. 1880-1885
    • Cheng, C.C.1    Chen, Y.C.2    Wang, H.J.3    Chen, W.R.4
  • 8
    • 0031535907 scopus 로고    scopus 로고
    • Characteristics of hydrogenated aluminum nitride films prepared by radio frequency reactive sputtering and their application to surface acoustic wave devices
    • Y. J. Jong, and J. Y. Lee, "Characteristics of hydrogenated aluminum nitride films prepared by radio frequency reactive sputtering and their application to surface acoustic wave devices," J. Vac. Sci. Technol., vol. A15, pp. 390-393, 1997.
    • (1997) J. Vac. Sci. Technol. , vol.A15 , pp. 390-393
    • Yong, Y.J.1    Lee, J.Y.2
  • 10
    • 0029306594 scopus 로고
    • The characterization of sputtered polycrystalline aluminum nitride on silicon by surface acoustic wave measurements
    • H. M. Liaw, and F. S. Hickernell, "The characterization of sputtered polycrystalline aluminum nitride on silicon by surface acoustic wave measurements," IEEE Trans. Ultrason. Ferroelectr. & Freq. Control, vol. 42, pp. 404-409, 1995.
    • (1995) IEEE Trans. Ultrason. Ferroelectr. & Freq. Control , vol.42 , pp. 404-409
    • Liaw, H.M.1    Hickernell, F.S.2
  • 11
    • 0032329150 scopus 로고    scopus 로고
    • Piezoelectric, dielectric, and interfacial properties of aluminum nitride films
    • D. Liufu, and K. C. Kao, "Piezoelectric, dielectric, and interfacial properties of aluminum nitride films," J. Vac. Sci. Technol., vol. A16, pp. 2360-2366, 1998.
    • (1998) J. Vac. Sci. Technol. , vol.A16 , pp. 2360-2366
    • Liufu, D.1    Kao, K.C.2
  • 12
    • 36449002342 scopus 로고
    • Preparation of aluminum nitride thin films by reactive sputtering and their applications to GHz-band surface acoustic wave devices
    • H. Okano, N. Tanaka, Y. Takahashi, K. Shibata, and S. Nakano, "Preparation of Aluminum Nitride Thin Films by Reactive Sputtering and Their Applications to GHz-Band Surface Acoustic Wave Devices," Appl. Phys. Lett. vol. 64, pp. 166-168, 1994.
    • (1994) Appl. Phys. Lett. , vol.64 , pp. 166-168
    • Okano, H.1    Tanaka, N.2    Takahashi, Y.3    Shibata, K.4    Nakano, S.5
  • 16
    • 0021495127 scopus 로고
    • X-cut quartz for improved surface acoustic wave temperature stability
    • R. T. Webster "X-cut Quartz for Improved Surface Acoustic Wave Temperature Stability," J. Appl. Phys. vol. 56, pp. 1540-1542, 1984.
    • (1984) J. Appl. Phys. , vol.56 , pp. 1540-1542
    • Webster, R.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.