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Volumn 82, Issue 9, 1997, Pages 4681-4683
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Growth kinetics and morphology of high quality AIN grown on Si(111) by plasma-assisted molecular beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
GROWTH KINETICS;
KINETIC THEORY;
MORPHOLOGY;
STOICHIOMETRY;
SUBSTRATES;
SURFACE ROUGHNESS;
SURFACES;
X RAY DIFFRACTION;
FULL WIDTH AT HALF MAXIMUM;
GROWTH TEMPERATURE;
PLASMA ASSISTED MOLECULAR BEAM EPITAXY;
MOLECULAR BEAM EPITAXY;
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EID: 0031274638
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.366208 Document Type: Article |
Times cited : (67)
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References (8)
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