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Volumn 82, Issue 9, 1997, Pages 4681-4683

Growth kinetics and morphology of high quality AIN grown on Si(111) by plasma-assisted molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GROWTH KINETICS; KINETIC THEORY; MORPHOLOGY; STOICHIOMETRY; SUBSTRATES; SURFACE ROUGHNESS; SURFACES; X RAY DIFFRACTION;

EID: 0031274638     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366208     Document Type: Article
Times cited : (67)

References (8)
  • 8
    • 0001422057 scopus 로고    scopus 로고
    • B. N. Sverdlov, G. A. Martin, H. Morkoç, and D. J. Smith, Appl. Phys. Lett. 67, 2063 (1995). See also: L. T, Romano, J. E. Northrup, and M. A. O'Keefe, Appl. Phys. Lett. 69, 2394 (1996).
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2394
    • Romano, L.T.1    Northrup, J.E.2    O'Keefe, M.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.