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Volumn 4780, Issue , 2002, Pages 115-125

Modelling of an ARS sensor system in spatial and time domain

Author keywords

ARS sensor; Calibrated CMOS photo detector array; Elliptical mirror system

Indexed keywords

ABERRATIONS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; LIGHT SCATTERING; MIRRORS; PHOTODETECTORS;

EID: 0036986650     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.452315     Document Type: Conference Paper
Times cited : (11)

References (11)
  • 2
    • 0035759537 scopus 로고    scopus 로고
    • Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array
    • in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds.
    • T. Rinder and H. Rothe, "Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array," in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds., Proc. SPIE (4447), pp. 53-64. 2001.
    • (2001) Proc. SPIE , vol.4447 , pp. 53-64
    • Rinder, T.1    Rothe, H.2
  • 3
    • 0032224674 scopus 로고    scopus 로고
    • Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces
    • in Scattering and Surface Roughness II, Z.-H. Gu and A. Maradudin, eds.
    • A. Kasper and H. Rothe, "Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces," in Scattering and Surface Roughness II, Z.-H. Gu and A. Maradudin, eds., Proc. SPIE (3426-27), pp. 252-261, 1998.
    • (1998) Proc. SPIE , vol.3426-3427 , pp. 252-261
    • Kasper, A.1    Rothe, H.2
  • 4
    • 0033679443 scopus 로고    scopus 로고
    • Design problems of a calibrated BRDF sensor with respect to dynamic range, speed, and large angle of view
    • in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds.
    • T. Rinder, H. Rothe, and A. Kasper, "Design problems of a calibrated BRDF sensor with respect to dynamic range, speed, and large angle of view," in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds., Proc. SPIE (4100), pp. 136-147, 2000.
    • (2000) Proc. SPIE , vol.4100 , pp. 136-147
    • Rinder, T.1    Rothe, H.2    Kasper, A.3
  • 5
    • 0032224157 scopus 로고    scopus 로고
    • Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans
    • in Scattering and Surface Roughness II, Z.-H. Gu and A. Maradudin, eds.
    • D. Hüser, T. Rinder, and H. Rothe, "Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans," in Scattering and Surface Roughness II, Z.-H. Gu and A. Maradudin, eds., Proc. SPIE (3426-47), pp. 262-272, 1998.
    • (1998) Proc. SPIE , vol.3426 , Issue.47 , pp. 262-272
    • Hüser, D.1    Rinder, T.2    Rothe, H.3
  • 6
    • 0032677215 scopus 로고    scopus 로고
    • Investigations of smooth surfaces by measuring the BRDF with a stray light sensor in comparison with PSD curves evaluated from topography of large AFM scans
    • in Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays, J. C. Stover, ed.
    • H. Rothe, D. Hüser, A. Kasper, and T. Rinder, "Investigations of smooth surfaces by measuring the BRDF with a stray light sensor in comparison with PSD curves evaluated from topography of large AFM scans," in Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays, J. C. Stover, ed., Proc. SPIE (3619), pp. 112-120, 1999.
    • (1999) Proc. SPIE , vol.3619 , pp. 112-120
    • Rothe, H.1    Hüser, D.2    Kasper, A.3    Rinder, T.4
  • 7
    • 0033724851 scopus 로고    scopus 로고
    • Polarized light-scattering measurements of polished and etched steel surfaces
    • in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds.
    • T. A. Gerner, T. Rinder, and H. Rothe, "Polarized light-scattering measurements of polished and etched steel surfaces," in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds., Proc. SPIE (4100), pp. 148-155, 2000.
    • (2000) Proc. SPIE , vol.4100 , pp. 148-155
    • Gerner, T.A.1    Rinder, T.2    Rothe, H.3
  • 8
    • 0004038250 scopus 로고
    • Addison-Wesley, 2. ed.
    • E. Hecht, Optics, Addison-Wesley, 2. ed., 1987.
    • (1987) Optics
    • Hecht, E.1
  • 9
    • 18544379285 scopus 로고    scopus 로고
    • Project SVAVISCA: A space-variant color CMOS sensor
    • in Advanced Focal Plane Arrays and Electronic Cameras II, T. M. Bernard, ed.
    • B. Dierickx, G. Sandini, D. Scheffer, and G. Meynants, "Project SVAVISCA: a space-variant color CMOS sensor," in Advanced Focal Plane Arrays and Electronic Cameras II, T. M. Bernard, ed., Proc. SPIE (3410). pp. 34-45, 1998.
    • (1998) Proc. SPIE , vol.3410 , pp. 34-45
    • Dierickx, B.1    Sandini, G.2    Scheffer, D.3    Meynants, G.4
  • 10
    • 0032403659 scopus 로고    scopus 로고
    • CMOS active pixel image sensor with CCD performance
    • in Advanced Focal Plane Arrays and Electronic Cameras II, T. M. Bernard, ed.
    • B. Dierickx, D. Scheffer, and G. Meynants, "CMOS active pixel image sensor with CCD performance," in Advanced Focal Plane Arrays and Electronic Cameras II, T. M. Bernard, ed., Proc. SPIE (3410), pp. 68-76, 1998.
    • (1998) Proc. SPIE , vol.3410 , pp. 68-76
    • Dierickx, B.1    Scheffer, D.2    Meynants, G.3
  • 11
    • 0013090890 scopus 로고    scopus 로고
    • Design issues on CMOS space-variant image sensors
    • in Advanced Focal Plane Arrays and Electronic Cameras, T. M. Bernard, ed.
    • F. Pardo, B. Dierickx, D. Scheffer, and G. Meynants, "Design issues on CMOS space-variant image sensors," in Advanced Focal Plane Arrays and Electronic Cameras, T. M. Bernard, ed., Proc. SPIE (2950), pp. 98-107, 1996.
    • (1996) Proc. SPIE , vol.2950 , pp. 98-107
    • Pardo, F.1    Dierickx, B.2    Scheffer, D.3    Meynants, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.