Near-field spectroscopic characterization of a 10 μm aperture selectively oxidized vertical cavity surface emitting laser

Journal of Applied Physics

Volumn 92, Issue 11, 2002, Pages 6837-6844

  Sharma, Aditi ^a   Yarrison Rice, Jan M ^b   Jackson, Howard E ^a   Choquette, K D ^c  

^a UNIVERSITY OF CINCINNATI   (United States)

^b MIAMI UNIVERSITY   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC CURRENTS; IMAGE PROCESSING; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OXIDATION; REFRACTIVE INDEX; SPECTROMETERS; THERMAL EFFECTS;

WAVELENGTHS;

LASERS;

EID: 0036904770     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1516624     Document Type: Article

References (28)

1. H. Soda, K. Iga, C. Kitahara, and Y. Suematsu, Jpn. J. Appl. Phys. 18, 2329 (1979).
2. See, for instance, K.D. Choquette and H.Q. Hou, Proc. IEEE 85, 1730 (1997); W.W. Chow, K.D. Choquette, M.H. Crawford, K.L. Lear, and G.R. Hadley, Int. J. Quantum Chem. 33, 1810 (1997); J.L. Jewell, J.P. Harbison, A. Scherer, Y.H. Lee, and L.T. Florez, ibid. 27, 1332 (1991).
3. See, for instance, K.D. Choquette and H.Q. Hou, Proc. IEEE 85, 1730 (1997); W.W. Chow, K.D. Choquette, M.H. Crawford, K.L. Lear, and G.R. Hadley, Int. J. Quantum Chem. 33, 1810 (1997); J.L. Jewell, J.P. Harbison, A. Scherer, Y.H. Lee, and L.T. Florez, ibid. 27, 1332 (1991).
4. See, for instance, K.D. Choquette and H.Q. Hou, Proc. IEEE 85, 1730 (1997); W.W. Chow, K.D. Choquette, M.H. Crawford, K.L. Lear, and G.R. Hadley, Int. J. Quantum Chem. 33, 1810 (1997); J.L. Jewell, J.P. Harbison, A. Scherer, Y.H. Lee, and L.T. Florez, ibid. 27, 1332 (1991).
5. K. Tai, R.J. Fischer, K.W. Wang, S.N.G. Chu, and A.Y. Cho, Electron. Lett. 25, 1644 (1989).
6. D.L. Huffaker, D.G. Deppe, K. Kumar, and T.J. Rogers, Appl. Phys. Lett. 65, 97 (1994).
7. K.D. Choquette, K.L. Lear, R.R Schneider, Jr., and K.M. Geib, Appl. Phys. Lett. 66, 3413 (1995).
8. K.D. Choquette, R.P. Schneider, Jr., K.L. Lear, and K.M. Geib, Electron. Lett. 30, 2043 (1994).
9. G.M. Yang, M.H. MacDougal, and P.D. Dapkus, Electron. Lett. 31, 886 (1995).
10. K.L. Lear, R.P. Schneider, Jr., K.D. Croquette, and S.P. Kilcoyne, IEEE Photonics Technol. Lett. 8, 740 (1996).
11. D. Vakshoori, J.D. Wynn, G.J. Zydik, R.E. Leibenguth, M.T. Asom, K. Kojima, and R.A. Morgan, Appl. Phys. Lett. 62, 1448 (1993).
12. L. Raddatz, I.H. White, H.D. Summers, K.H. Hahn, M.R. Tran, and S.Y. Wang, IEEE Photonics Technol. Lett. 8, 743 (1996).
13. G. Hasnain, K. Tai, L. Yang, Y.H. Wang, R.J. Fischer, J.D. Wynn, B. Weir, N.K. Dutta, and A.Y. Cho, IEEE J. Quantum Electron. 27, 1377 (1991).
14. I. Horsch, R. Kusche, O. Marti, B. Weigl, and K.J. Ebeling, J. Appl. Phys. 79, 3831 (1996).
15. K.J. Knopp, D.H. Christensen, G. Vander Rhodes, J.M. Pomeroy, B.B. Goldberg, and M.S. Unlu, J. Lightwave Technol. 17, 1429 (1999).
16. J. Kim, D.E. Pride, J.T. Boyd, and H.E. Jackson, Appl. Phys. Lett. 72, 3112 (1998).
17. K. Kim, J.T. Boyd, and H.E. Jackson, Appl. Phys. Lett. 76, 526 (2000).
18. W.D. Herzog, M.S. Unlu, B.B. Goldberg, G.H. Rhodes, and C. Harder, Appl. Phys. Lett. 70, 688 (1997).
19. S.P. Hegarty, G. Huyet, P. Porta, J.G. McInerney, K.D. Choquette, K.M. Geib, and H.Q. Hou, J. Opt. Soc. Am. B 16, 2060 (1999).
20. C. Degen, I. Fischer, and W. Elsaßer, Appl. Phys. Lett. 76, 3352 (2000).
21. T. Rossler, R.A. Indik, G.K. Harkness, J.V. Moloney, and C.Z. Ning, Phys. Rev. A 58, 3279 (1998).
22. Landolt-Bornstein New Series, Semiconductors: Group IV Elements and III-V Compounds, edited by O. Madelung (Springer, Berlin, 1982), Vol. III/17a.
23. Y.G. Zhao and J.G. McInerney, IEEE J. Quantum Electron. 32, 1950 (1996).
24. W. Nakwaski and R.P. Sarzala, Opt. Commun. 148, 63 (1998).
25. Z. Hang, D. Yah, F.H. Pollak, G.D. Tettit, and J.M. Woodall, Phys. Rev. B 44, 10546 (1991).
26. Y.G. Zhao and J.G. McInerney, IEEE J. Quantum Electron. 31, 1668 (1995).
27. A. Yariv, Optical Electronics in Modern Communications, 5th ed. (Oxford University Press, New York, 1997).
28. S.P. Hegarty, G. Huyet, J.G. McInerney, K.D. Coquette, K.M. Geib, and H.Q. Hou, Appl. Phys. Lett. 73, 596 (1998).