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Volumn 8, Issue 6, 1996, Pages 743-745
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Measurement of guiding effects in vertical-cavity surface-emitting lasers
d d a,b c c c
d
NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRIC CURRENTS;
ION IMPLANTATION;
LENSES;
LIGHT EMISSION;
OPTICAL VARIABLES MEASUREMENT;
OPTICAL WAVEGUIDES;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR QUANTUM WELLS;
SPECTRUM ANALYZERS;
SUBSTRATES;
MICROMETER GAUGE;
OPTICAL SPECTRUM ANALYZERS;
PROTON IMPLANTATION;
SPECTRALLY RESOLVED MEASUREMENT;
SPONTANEOUS EMISSION;
STIMULATED EMISSION;
VERTICAL CAVITY SURFACE EMITTING LASERS;
SEMICONDUCTOR LASERS;
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EID: 0030165851
PISSN: 10411135
EISSN: None
Source Type: Journal
DOI: 10.1109/68.502080 Document Type: Article |
Times cited : (15)
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References (8)
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