Low-energy foil aberration corrector

Ultramicroscopy

Volumn 93, Issue 3-4, 2002, Pages 321-330

  Van Aken, R H ^a   Hagen, C W ^a   Barth, J E ^a   Kruit, P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Aberration correction; Chromatic aberration; Foil; Spherical aberration

Indexed keywords

ELECTRON MICROSCOPES; SCANNING ELECTRON MICROSCOPY;

ELECTRON TRANSMISSIONS;

ABERRATIONS;

ANALYTICAL ERROR; ARTICLE; CALCULATION; DEVICE; ELECTRIC POTENTIAL; ELECTRON; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; ENERGY; FOIL; IMAGE ENHANCEMENT; METHODOLOGY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036890969     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00287-5     Document Type: Article

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