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Volumn 93, Issue 2, 2002, Pages 169-178
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An assay for local quality in cryo-electron micrographs of single particles
a a a a |
Author keywords
Contrast transfer function; Correspondence analysis; Three dimensional reconstruction
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Indexed keywords
ASSAYS;
ELECTRON MICROSCOPY;
IMAGE QUALITY;
IMAGE RECONSTRUCTION;
TRANSFER FUNCTIONS;
MICROGRAPHS;
MICROSCOPIC EXAMINATION;
CARBON;
ICE;
ANALYTIC METHOD;
ARTICLE;
CORRESPONDENCE ANALYSIS;
CRYOELECTRON MICROSCOPY;
IMAGE ANALYSIS;
IMAGE QUALITY;
IMAGE RECONSTRUCTION;
POWER SPECTRUM;
SCREENING TEST;
SURFACE CHARGE;
THICKNESS;
CRYOELECTRON MICROSCOPY;
IMAGE PROCESSING, COMPUTER-ASSISTED;
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EID: 0036837519
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(02)00157-2 Document Type: Article |
Times cited : (8)
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References (25)
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