Reduction of charging in protein electron cryomicroscopy

Journal of Microscopy

Volumn 191, Issue 1, 1998, Pages 67-73

  Brink, J ^a   Gross, H ^b   Tittmann, P ^b   Sherman, M B ^a   Chiu, W ^a  

^a BAYLOR COLLEGE OF MEDICINE   (United States)

^b ETH ZURICH   (Switzerland)

Author keywords

Charging; Electron diffraction pattern; Electron gun equipped evaporator; High resolution; Ion beam coater; Spot scan imaging; Surface deposit

Indexed keywords

COATINGS; CONDUCTIVE FILMS; CRYSTAL STRUCTURE; DEPOSITS; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRON GUNS; ELECTRONS; FILM PREPARATION; INTERFEROMETRY; ION BEAMS; PROTEINS; SPUTTERING; THERMAL EVAPORATION;

% REDUCTIONS; CHARGING; ELECTRON CRYO MICROSCOPIES; ELECTRON DIFFRACTION PATTERN; ELECTRON GUN-EQUIPPED EVAPORATOR; HIGH RESOLUTION; ION BEAM COATER; ION-BEAM-SPUTTERING; SPOT-SCAN IMAGING; SURFACE DEPOSITS;

IONS;

CATALASE; PROTEIN;

ARTICLE; CRYOELECTRON MICROSCOPY; ELECTRON DIFFRACTION; FOURIER TRANSFORMATION; IMAGING SYSTEM; PRIORITY JOURNAL;

EID: 0031830886     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.00342.x     Document Type: Article

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