DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 18, Issue 2, 1999, Pages 151-162

  Pleskacz, Witold A ^a   Ouyang, Charles H ^a   Maly, Wojciech ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; COMPUTER AIDED NETWORK ANALYSIS; INTEGRATED CIRCUIT LAYOUT;

CRITICAL AREAS EXTRACTION; DESIGN RULE CHECKER (DRC); OPEN FAULTS;

VLSI CIRCUITS;

EID: 0033078738     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.743724     Document Type: Article

References (18)