The behavior and testing implications of CMOS IC logic gate open circuits

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 302-310

  Henderson, Christopher L ^a   Soden, Jerry M ^a   Hawkins, Charles F ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; LOGIC GATES;

OPEN CIRCUIT DEFECT STRUCTURES; TUNNELING CURRENT;

INTEGRATED CIRCUIT TESTING;

EID: 0026618712     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)