An effect of vicinal surface morphology on adsorbate structure: Yb growth on [1 1 2̄]-tilt Si (1 1 1)

Surface Science

Volumn 515, Issue 2-3, 2002, Pages 471-482

  Kuzmin, M ^a,b   Laukkanen, P ^a   Vanne, R L ^a   Vayrynen I J ^a  

^a UNIVERSITY OF TURKU   (Finland)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

Lanthanides; Low energy electron diffraction (LEED); Metal semiconductor interfaces; Scanning tunneling microscopy; Silicon; Stepped single crystal surfaces; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR METAL BOUNDARIES; SILICON; YTTERBIUM;

ADSORBATE STRUCTURE; SURFACE RELAXATION;

SURFACE ROUGHNESS;

EID: 0036720791     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01962-3     Document Type: Article

References (58)