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Volumn 33, Issue 8, 2002, Pages 681-686
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Comparison of source functions obtained by using QUASES and partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni+
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Author keywords
AES; Copper; Inelastic background; Nickel; Partial intensity analysis; QUASES
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
COPPER;
ELECTRON SCATTERING;
NICKEL;
PHOTONS;
SUBSTRATES;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
SURFACE EXTRINSIC LOSSES;
SURFACE CHEMISTRY;
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EID: 0036685688
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1442 Document Type: Article |
Times cited : (5)
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References (13)
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