SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 122, Issue 2, 2002, Pages 103-114

Line shape analysis of high energy X-ray induced Auger- and photoelectron spectra of thin Cu and Ni films

(4) Werner, Wolfgang S M a Kövér, László b Tóth, József b Varga, Dezsó b

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b INSTITUTE OF EXPERIMENTAL MEDICINE (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER; ELECTRONIC DENSITY OF STATES; METALLIC FILMS; NICKEL; POLYCRYSTALLINE MATERIALS; SPECTROMETERS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SCATTERING;

SURFACE EXCITATIONS;

THIN FILMS;

EID: 0036466970 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(01)00347-4 Document Type: Article

Times cited : (13)

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