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Volumn 515, Issue 1, 2002, Pages 199-204

Sn thin film growth on Si(111) surface studied by CAICISS

Author keywords

Growth; Ion scattering spectroscopy; Low energy ion scattering (LEIS); Metallic films; Polycrystalline thin films; Silicon; Surface structure, morphology, roughness, and topography; Tin

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; METALLIC FILMS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SPECTROSCOPIC ANALYSIS; THIN FILMS; TIN;

EID: 0036683583     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01885-X     Document Type: Article
Times cited : (7)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.