Fourier transform infrared microscopy: Some advances in techniques for characterisation and structure-property elucidations of industrial material

Analyst

Volumn 123, Issue 4, 1998, Pages 579-586

  Chalmers, John M ^a   Everall, Neil J ^a   Hewitson, Karen ^a,e   Chesters, Michael A ^b   Pearson, Martin ^b   Grady, Andrew ^c   Ruzicka, Barbara ^d  

^a AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^c Hemel Hempstead   (United Kingdom)

^d DARESBURY LABORATORY   (United Kingdom)

^e SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

Fourier transform infrared microscopy; Infrared imaging; Polymers; Specular reflectance; Synchroton radiation

Indexed keywords

INDUSTRIAL CHEMICAL; POLYETHYLENE;

ANALYTIC METHOD; CHEMICAL STRUCTURE; CONFERENCE PAPER; CRYSTAL STRUCTURE; IMAGING; INFRARED SPECTROSCOPY; PROBLEM SOLVING; SYNCHROTRON;

EID: 0031968232     PISSN: 00032654     EISSN: None     Source Type: Journal    
DOI: 10.1039/a707070e     Document Type: Conference Paper

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