High-precision large deflection measurements of thin films using time sequence speckle pattern interferometry

Measurement Science and Technology

Volumn 13, Issue 8, 2002, Pages 1304-1310

  Li, Xide ^a   Soh, Ai Kah ^b   Deng, Bin ^a   Guo, Xianghua ^a  

^a TSINGHUA UNIVERSITY   (China)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Large deformation; Thin film; Time sequence speckle pattern interferometry

Indexed keywords

DEFORMATION; INTERFEROMETRY; SENSITIVITY ANALYSIS; SPECKLE; THIN FILMS;

DEFLECTION MEASUREMENT;

MECHANICAL VARIABLES MEASUREMENT;

FILM; INTERFEROMETRY;

EID: 0036677484     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/13/8/319     Document Type: Article

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