SCOPUS 정보 검색 플랫폼

Volumn 36, Issue 5, 2001, Pages 437-450

Microscopic grid methods - Resolution and sensitivity

Author keywords

Atomic force microscope; Fourier transform; Grid method; Optical microscope; Scanning electronic microscope; Spatial resolution

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS;

MICROSCOPIC GRID METHODS;

OPTICAL RESOLVING POWER;

EID: 0035499130 PISSN: 01438166 EISSN: None Source Type: Journal
DOI: 10.1016/S0143-8166(01)00071-9 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.