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Volumn 94, Issue 2-3, 2002, Pages 159-163

Characterization of Ni-implanted GaN and SiC

(8) Pearton, S J a Theodoropoulou, N b Overberg, M E a Abernathy, C R a Hebard, A F b Chu, S N G c Wilson, R G d Zavada, J M e

a UNIVERSITY OF FLORIDA (United States)

b University of Florida (United States)

c AGERE SYSTEMS (United States)

d Army Research Office ^*

e U S ARMY RESEARCH OFFICE (United States)

Author keywords

Ferromagnetism; Magnetic ions; Ni

Indexed keywords

ANNEALING; CHARACTERIZATION; CRYSTAL LATTICES; FERROMAGNETISM; ION IMPLANTATION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NICKEL; SILICON CARBIDE; SUBSTRATES; SUPERCONDUCTING TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETIC IONS;

GALLIUM NITRIDE;

EID: 0036606712 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(02)00056-9 Document Type: Article

Times cited : (6)

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