Further evaluation of the Exicor birefringence measurement system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4103, Issue , 2000, Pages 12-18

  Wang, Baoliang ^a  

^a Hinds Instruments Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; LIGHT MODULATORS; PHOTOELASTICITY;

LINEAR BIREFRINGENCE MEASUREMENT SYSTEMS;

OPTICAL SYSTEMS;

EID: 0033650789     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.403586     Document Type: Conference Paper

References (8)