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Journal of Electronic Materials

Volumn 31, Issue 5, 2002, Pages 351-355

Interactions between intrinsic defects and nitrogen/boron impurities in high-resistivity 4H SiC: Electron paramagnetic resonance study

(2) Konovalov, V V a Zvanut, M E a

a UNIVERSITY OF ALABAMA AT BIRMINGHAM (United States)

Author keywords

4H SiC; Boron; EPR; Impurities; Intrinsic defects; Nitrogen; Photo induced charge transfer

Indexed keywords

BORON; CHARGE TRANSFER; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; DOPING (ADDITIVES); NITROGEN; PARAMAGNETIC RESONANCE; PARAMAGNETISM; VANADIUM;

INTRINSIC DEFECTS;

SILICON CARBIDE;

EID: 0036575573 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-002-0081-z Document Type: Article

Times cited : (3)

References (18)

1
- 0001599099
- ed. S.T. Pantelides (New York: Gordon mad Breach Science Publ.)
- (1986) Deep Centers in Semiconductors , pp. 147-183
- Watkins, G.D.¹

2
- 0343326254
- (1970) J. Phys. C , vol.3 , pp. 2344
- Balona, L.A.S.¹ Loubster, J.H.N.²

3
- 0027575905
- (1993) Physica B , vol.185 , pp. 199
- Schneider, J.¹ Maier, K.²

4
- 18144444695
- (1997) Defect Diffusion Forum , vol.148-149 , pp. 129
- Baranov, P.G.¹

5
- 0032256806
- (1998) Phys. Status Solidi , vol.210 , pp. 415
- Greulich-Weber, S.¹

6
- 0033075954
- (1999) Semicond. , vol.33 , pp. 107
- Lebedev, A.A.¹

7
- 0342607968
- (1999) Physica Scripta , vol.T79 , pp. 46
- Son, T.N.¹ Chen, W.M.² Lindström, J.L.³ Monemar, B.⁴ Janzen, E.⁵

8
- 0000231842
- (2000) Phys. Rev. B , vol.61 , pp. 2613
- Sörman, E.¹ Son, T.N.² Chen, W.M.³ Kordina, O.⁴ Hallin, C.⁵ Janzen, E.⁶

9
- 36549092940
- (1990) Appl. Phys. Lett. , vol.56 , pp. 1184
- Schneider, J.¹ Mûller, H.D.² Maier, K.³ Wilkening, W.⁴ Fuchs, F.⁵ Dörnen, A.⁶ Leibenzeder, S.⁷ Stein, R.⁸

10
- 36449005454
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1364
- Hobgood, H.M.¹ Glass, R.² Augustine, A.³ Hopkins, R.H.⁴ Jenny, J.⁵ Skowronski, M.⁶ Mitchel, W.C.⁷ Roth, M.⁸

11
- 0009513965
- Abstract (University of Notre Dame, Notre Dame, IN, 27-29 June)
- (2001) 43rd Electronic Materials Conf.
- Jenny, J.R.¹ Müller, S.G.² Powell, A.³ Brady, M.⁴ Tsvetkov, V.F.⁵ Hobgood, H.M.⁶ Glass, R.C.⁷ Carter, C.H.⁸

12
- 0007598587
- Abstract (Washington, DC, 8 April-1 May)
- (2001) APS Spring Meeting
- Konovalov, V.V.¹ Geislinger, B.² Zvanut, M.E.³

13
- 0009479494
- (2001) Physica B , vol.308-310 , pp. 631
- Konovalov, V.V.¹ Zvanut, M.E.² Tsvetkov, V.F.³ Jenny, J.R.⁴ Müller, S.G.⁵ Hobgood, H.M.⁶

14
- 79956048864
- (2002) Appl. Phys. Lett. , vol.80 , pp. 410
- Zvanut, M.E.¹ Konovalov, V.V.²

15
- 36849121040
- (1961) J. Appl. Phys. , vol.32 , pp. 1854
- Walters, G.K.¹ Estle, T.L.²

16
- 0031187576
- (1997) Phys. Status Solidi , vol.162 , pp. 153
- Baur, J.¹ Kunzer, M.² Schneider, J.³

17
- 0034888268
- (2001) Phys. Rev. B , vol.63 , pp. 201201
- Son, N.T.¹ Hai, P.N.² Jansen, E.³

18
- 14344284767
- (2001) Mater. Sci. Forum , vol.353-356 , pp. 517
- Bratus, V.Y.¹ Makeeva, I.N.² Okulov, S.M.³ Petrenko, T.L.⁴ Petrenko, T.T.⁵ Von Bardeleben, H.J.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.