Optical parameters in SnO2 nanocrystalline textured films grown on p-InSb (1 1 1) substrates

Journal of Physics and Chemistry of Solids

Volumn 63, Issue 5, 2002, Pages 881-885

  Kim, T W ^a   Lee, D U ^a   Choo, D C ^a   Kim, J H ^a   Kim, H J ^a   Jeong, J H ^a   Jung, M ^a   Bahang, J H ^b   Park, H L ^b   Yoon, Y S ^c   Kim, J Y ^a  

^a Kwangwoon University   (South Korea)

^b Yonsei University   (South Korea)

^c Korea Institute of Science and Technology   (South Korea)

Author keywords

A. Semiconductors; D. Optical properities

Indexed keywords

ELLIPSOMETRY; ENERGY GAP; FILM GROWTH; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; SEMICONDUCTING TIN COMPOUNDS; SPECTRUM ANALYSIS; TEXTURES;

NANOCRYSTALLINE FILMS;

THIN FILMS;

EID: 0036567743     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(01)00243-8     Document Type: Article

References (18)