Transmission electron microscopy investigation of tin sub-oxide nucleation upon SnO2 deposition on silicon

Applied Physics Letters

Volumn 68, Issue 9, 1996, Pages 1207-1208

  Alfonso, Claude ^a   Charaï, Ahmed ^a   Armigliato, Aldo ^b   Narducci, Dario ^c  

^a AIX MARSEILLE UNIVERSITY   (France)

^b CNR   (Italy)

^c UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000722320     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115970     Document Type: Article

References (7)

1. D. Narducci, G. Girardi, C. M. Mari, and S. Pizzini, Sens. Actuators B INS 24-25, 266 (1995).
2. D. Narducci, S. Pizzini, and F. Morazzoni, in Proceedings of the Symposium on Chemical Sensors II (The Electrochemical Society, Pittsburgh, PA, 1993), Vol. 93-7, p. 325.
3. P. Scardi (private communication).
4. ASTM X-ray Card No. 25-1260.
5. R. L. Anderson, Appl. Phys. Lett. AIP 27, 691 (1975).
6. G. V. Samsonov, The Oxide Handbook (IFI/Plenum, New York, 1973).
7. B. J. Masters and E. F. Gorey, Appl. Phys. Lett. AIP 49, 2717