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Volumn 9, Issue 2, 2002, Pages 1047-1052

Usxes and optical phenomena in Si low-dimensional structures dependent on morphology and silicon oxide composition on Si surface

(10) Torchynska, T V a Morales Rodriguez, M a Polupan, G P a Khomenkova, L I b Korsunskaya, N E b Papusha, V P b Scherbina, L V b Domashevskaya, E P c Terekhov, V A c Turischev, S Yu c

a INSTITUTO POLITÉCNICO NACIONAL (Mexico)

b INSTITUTE OF SEMICONDUCTOR PHYSICS (Ukraine)

c VORONEZH STATE UNIVERSITY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; SILICON DERIVATIVE;

ANALYTIC METHOD; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CONFERENCE PAPER; CRYSTAL STRUCTURE; ELECTROCHEMISTRY; INFRARED SPECTROSCOPY; PHOTOLUMINESCENCE; POROSITY; ROENTGEN SPECTROSCOPY; SURFACE PROPERTY;

EID: 0036552936 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X02003329 Document Type: Conference Paper

Times cited : (12)

References (26)

1
- 0001753504
- (1997) J. Appl. Phys. , vol.82 , pp. 909
- Cullis, A.G.¹ Canham, L.T.² Calcott, P.D.J.³

2
- 0027303515
- (1993) Jpn. J. Appl. Phys. , vol.32 , pp. 411
- Kanemitsu, Y.¹ Matsumoto, T.² Futagi, T.³

3
- 0000631355
- (1993) Appl. Phys. Lett. , vol.62 , pp. 1099
- Lavine, J.M.¹ Sawan, S.P.² Shieh, Y.T.³ Bellezza, A.J.⁴

4
- 0000210622
- (1993) Phys. Rev. , vol.B48 , pp. 8172
- Fuchs, H.D.¹ Stutzmann, M.² Brandt, M.S.³ Rosenbauer, M.⁴ Weber, J.⁵ Breischwerdt, A.⁶ Deak, P.⁷ Cardona, M.⁸

5
- 0000317389
- (1992) Phys. Rev. , vol.B45 , pp. 13788
- Prokes, S.M.¹ Glembocli, O.J.² Berdudez, V.M.³ Kaplan, R.⁴

6
- 0010341423
- Boston, USA
- (1995) H. J. Proc. 1995 MRS Fall Meeting
- Torchinskaya, T.V.¹ Korsunskaya, N.E.² Dzumaev, B.³ Sheinkman, M.K.⁴

7
- 4244076410
- (2001) J. Electron Spectrosc. Relat. Phenom. , vol.114-116 , pp. 235
- Torchynska, T.V.¹ Palacios Gomez, J.² Polupan, G.P.³ Becerril Espinoza, F.G.⁴ Flores Gonzalez, H.A.⁵ Ita de Torre, A.⁶ Bulakh, B.M.⁷ Scherbina, L.V.⁸

8
- 0034300805
- (2000) Appl. Surf. Science , vol.167 , pp. 197
- Torchynska, T.V.¹ Palacios Gomez, J.² Polupan, G.P.³ Becerril Espinoza, F.G.⁴ Garcia Borquez, A.⁵ Korsunskaya, N.E.⁶ Khomenkova, L.Yu.⁷

9
- 35949006582
- (1993) Phys. Rev. , vol.B48 , pp. 4883
- Kanemitsu, Y.¹ Ogawa, T.² Shiraishi, K.³ Takeda, K.⁴

10
- 0033350971
- (1999) Physica , vol.B273-274 , pp. 955
- Torchynska, T.V.¹ Khomenkova, L.I.² Korsunska, N.E.³ Sheinkman, M.K.⁴

11
- 0010387196
- (1997) , vol.72 , pp. 400
- Torchynskaya, T.V.¹ Korsunskaya, N.E.² Khomenkova, L.Yu.³ Dzumaev, B.R.⁴ Sheinkman, M.K.⁵ Baran, N.P.⁶ Luminescence, J.⁷

12
- 0010387197
- to be published
- J. Phys. Chem. Solids
- Torchynska, T.V.¹

13
- 0033904370
- (2000) J. Phys. Chem. Solids , vol.61 , pp. 937
- Torchynska, T.V.¹ Khomenkova, L.I.² Korsunska, N.E.³ Dzumaev, B.R.⁴

14
- 0029269786
- (1995) Sol. State Commun. , vol.93 , pp. 841
- Murayama, K.¹ Miyazaki, S.² Hirose, M.³

15
- 0034670789
- (2000) Phys. Rev. , vol.B62 , pp. 16595
- Zou, B.¹ Wang, Y.² Liu, C.³ Zhang, J.Z.⁴ El-Sayed, M.A.⁵

16
- 0002874117
- (1992) Proc. Mat. Res. Soc. Symp. , vol.256 , pp. 47
- Macaulay, J.M.¹ Ross, F.M.² Seatson, P.C.³ Sputz, S.K.⁴ People, R.⁵ Friedersdorf, L.E.⁶

17
- 36449000107
- (1992) Appl. Phys. Lett. , vol.60 , pp. 2285
- Friedersdorf, L.E.¹ Searson, P.C.² Prokes, S.M.³ Glembocki, O.J.⁴ Macaulay, J.M.⁵

18
- 0001433676
- (1992) Appl. Phys. Lett. , vol.60 , pp. 3295
- Prokes, S.M.¹ Freitas, J.A.² Searson, P.C.³

19
- 0026854364
- (1992) Jpn. J. Appl. Phys. , vol.31
- Noguchi, N.¹ Suemune, I.² Yamanishi, M.³ Hua, G.C.⁴ Otsuka, N.⁵

20
- 0000140071
- (1996) Semiconductors (USA) , vol.30 , pp. 792
- Torchinskaya, T.V.¹ Korsunskaya, N.E.² Dzumaev, B.³ Bulakh, B.M.⁴ Smiyan, O.D.⁵ Kapitanchuk, A.L.⁶ Antonov, S.O.⁷

21
- 0032310099
- Proc. Int. Semiconductor Conf., CAS'98, Romania
- (1998) Oxidation Process Effects on Porous Silicon Photoluminescence , pp. 451
- Torchinskaya, T.V.¹ Korsunskaya, N.E.² Sheinkman, M.K.³ Khomenkova, L.Yu.⁴ Kapitanchuk, A.L.⁵ Goldstein, Y.⁶ Savir, E.⁷ Many, A.⁸

22
- 0027680626
- (1993) J. Electrochem. Soc. , vol.140 , pp. 3046
- Jung, K.H.¹ Shih, S.² Kwong, D.L.³

23
- 0010418406
- (1997) Fiz. Tverd. Tela , vol.39 , pp. 243
- Terekhov, V.A.¹ Khokhlov, A.F.² Kovalyova, N.S.³ Kashkarov, V.M.⁴

24
- 0033726821
- (2000) Microelectronics & Engineering , vol.51-52 , pp. 485
- Torchynska, T.V.¹ Korsunskaya, N.E.² Khomenkova, L.Yu.³ Dzhumaev, B.R.⁴ Prokes, S.M.⁵

25
- 0035155923
- (2001) Thin Solid Films , vol.381 , Issue.1 , pp. 88
- Torchynska, T.V.¹ Korsunskaya, N.E.² Khomenkova, L.Yu.³ Dzhumaev, B.R.⁴ Prokes, S.M.⁵

26
- 0001395514
- (1992) Phys. Rev. , vol.B45 , pp. 1187
- Bouzidi, S.¹

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