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Volumn 273-274, Issue , 1999, Pages 955-958
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OH-related emitting centers in interface layer of porous silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LIGHT ABSORPTION;
PHOTOLUMINESCENCE;
POROUS SILICON;
SECONDARY ION MASS SPECTROMETRY;
PHOTOLUMINESCENCE EXCITATION MECHANISMS;
SEMICONDUCTING SILICON;
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EID: 0033350971
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)00563-3 Document Type: Article |
Times cited : (33)
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References (11)
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