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Volumn 273-274, Issue , 1999, Pages 955-958

OH-related emitting centers in interface layer of porous silicon

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; PHOTOLUMINESCENCE; POROUS SILICON; SECONDARY ION MASS SPECTROMETRY;

EID: 0033350971     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00563-3     Document Type: Article
Times cited : (33)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.