Effect of the microstructure on the electronic transport in hydrogenated microcrystalline silicon

Journal of Non-Crystalline Solids

Volumn 299-302, Issue PART 1, 2002, Pages 390-394

  Wyrsch, Nicolas ^a   Droz, C ^a   Feitknecht, L ^a   Torres, P ^a   Vallat Sauvain, E ^a   Bailat, J ^a   Shah, A ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALS; ELECTRONIC PROPERTIES; FERMI LEVEL; HYDROGENATION; MICROSTRUCTURE; SUBSTRATES;

DILUTION;

SEMICONDUCTING SILICON;

EID: 0036539024     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)01013-4     Document Type: Conference Paper

References (16)