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Volumn 82, Issue 3, 2002, Pages 119-124

Dislocation core structures in GaN grown on Si(111) substrate

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; FILM GROWTH; GALLIUM NITRIDE; HIGH RESOLUTION ELECTRON MICROSCOPY; SILICON; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036507483     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/095008302317262615     Document Type: Article
Times cited : (6)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.