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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4105, Issue , 2001, Pages 236-242

Degradation mechanisms in organic light emitting diodes

(4) Shen, J a Wang, D a Langlois, E a Yang, J a

a Arizona State University (United States)

Author keywords

Degradati on; Electroluminescent; Lifetime; Light emitting; Mobile ions; Organic; Reliability

Indexed keywords

DEGRADATION; ELECTRIC POTENTIAL; ELECTRON TRANSPORT PROPERTIES; HETEROJUNCTIONS; HOLE MOBILITY; INTERFACES (MATERIALS); IONS; POLARIZATION; RELIABILITY; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

BIAS POLARITY; CARRIER INJECTION; DEGRADATION MECHANISMS; DRIVING VOLTAGE; MOBILE IONS; ORGANIC LIGHT EMITTING DIODES;

LIGHT EMITTING DIODES;

EID: 0035051965 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.416899 Document Type: Conference Paper

Times cited : (6)

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