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Volumn 41, Issue 2 A, 2002, Pages 698-701

IrO2/Pb(Zr,Ti)O3/Pt capacitor degradation with D2 gas at elevated temperature

Author keywords

Degradation; Deuterium; Diffusion; Hydrogen; PZT; SIMS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEGRADATION; DEUTERIUM; DIFFUSION; ELECTRODES; FERROELECTRIC DEVICES; HYSTERESIS; IRIDIUM COMPOUNDS; POLARIZATION; SECONDARY ION MASS SPECTROMETRY;

EID: 0036478557     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.698     Document Type: Article
Times cited : (12)

References (17)
  • 1
    • 0009728321 scopus 로고    scopus 로고
    • FRAM is a registered trademark of Ramtron International Corporation, Colorado, USA
  • 14
    • 0009675461 scopus 로고    scopus 로고


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.