SCOPUS 정보 검색 플랫폼

Volumn 11, Issue 2, 2002, Pages 212-217

Influence of annealing on the electronic properties of chemical vapor deposited diamond films studied by high vacuum scanning tunneling microscopy and spectroscopy

(6) Cannaerts, M a Nesladek, M b Haenen, K b De Schepper, L b Stals, L M b Van Haesendonck, C a

a UNIVERSITY OF LEUVEN (Belgium)

b HASSELT UNIVERSITY (Belgium)

Author keywords

Electrical conductivity; Hydrogen; Scanning tunneling microscopy; Spectroscopy

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; LOW TEMPERATURE EFFECTS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; VACUUM;

HYDROGEN TERMINATION;

DIAMOND FILMS;

DIAMOND COATING; ELECTRICAL PROPERTY;

EID: 0036472614 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-9635(01)00645-8 Document Type: Article

Times cited : (6)

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